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  Information - GMPV1 Nanoscale analytical and high-resolution (S)TEM techniques for the characterisation of environmental and geological processes

Event Information
The high spatial resolution available within the new generation (scanning) transmission electron microscopes (S)TEMs allows for the detailed analysis of mineral intergrowths, inclusions and interfaces, such as, grain, twin and antiphase boundaries, stacking faults and domain boundaries on the nanoscale. Energy dispersive X-ray (EDS) microanalysis and electron energy loss spectroscopy (EELS) permit full elemental detection and quantification across virtually the whole periodic table enabling the analysis of the detailed geological evolution of mineral reactions. Associated techniques such as EDS mapping, High-Angle Annular Dark Field (HAADF) STEM, and particularly energy-filtered TEM (EFTEM) provide rapid high resolution imaging of elemental distributions. Additional benefits of EELS include the ability to determine nearest neighbour co-ordinations, valences and bond lengths associated with atomic species in mineralogical samples. EELS and EDS combined with Atom Location by Channelling Enhanced Microanalysis (ALCHEMI) enhances the crystallographic site specificity of such information.

These techniques have profoundly contributed to our understanding of the bioshpere and geosphere—from such diverse settings as the Earth’s surface to the mantle and on to extraterrestrial sites. As the nanoscale has become more important to environmental and microbial studies, as well as the need for greater detail in higher temperature processes, careful integration of these techniques into multidiscipline approaches has become essential. Hence, this symposium aims to attract users of these (and related) techniques to present the current state-of-the-art in high spatial resolution geological/mineralogical microanalysis, to showcase new areas of their applications, and highlight technique development.

Preliminary List of Solicited Speakers


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